Worked Examples in X-Ray Analysis

Front Matter....Pages i-xii
Characteristic spectra Moseley’s law....Pages 1-3
Characteristic spectra — prediction of possible transitions....Pages 4-5
Continuous spectra — use of Kramers’ formula....Pages 6-8
Continuous radiation — Scattered radiation....Pages 9-11
Detector resolution....Pages 12-13
Dispersion as a function of ‘d’ spacing....Pages 14-15
Choice of collimator/crystal combination....Pages 16-18
Pulse height selection — crystal fluorescence....Pages 19-21
Pulse height selection — pulse height variation....Pages 22-24
Detectors — double plateaux....Pages 25-27
Choice of detectors....Pages 28-29
Count rate differences with Geiger and proportional counters....Pages 30-31
Dispersion of the diffractometer....Pages 32-34
Removal of sample fluorescence....Pages 35-39
Spurious peaks in X-ray diffractograms....Pages 40-42
Extra lines in X-ray diffractometry....Pages 43-45
Counting statistics — variation of standard deviation with counting time....Pages 46-47
Estimation of Error Introduced by Ignoring the Background....Pages 48-50
Trace analysis — derivation of detection limit expression....Pages 51-52
Choice between fixed time and fixed count....Pages 53-54
Choice between ratio and absolute counting methods....Pages 55-56
Variation of limit of detection with analysis time....Pages 57-58
Analytical error due to counting statistics....Pages 59-60
Particle statistics in X-ray diffractometry....Pages 61-63
Determination of traces of lead in oil (absolute measurement)....Pages 64-66
Determination of CaO in cement (ratio measurement)....Pages 67-69
Measurement of, and correction for, absorption in trace analysis of whole rock....Pages 70-72
Calculation of matrix absorption and prediction of absorption effects....Pages 73-74
Calculation of absorption coefficients and absorption effects....Pages 75-76
Absorption correction involving primary and secondary absorption....Pages 77-78
Effect of matric absorption on sensitivity....Pages 79-80
Calculation of quantity of heavy absorber needed to minimize matrix effects....Pages 81-82
Use of α correction factor (intensity correction)....Pages 83-86
Use of α correction factors (concentration correction)....Pages 87-92
Excitation probability....Pages 93-95
Quantitative diffractometry — determination of Anatase in Rutile....Pages 96-98
Quantitative X-ray diffractometry use of internal standard....Pages 99-100
Estimation of expected intensities in mixtures....Pages 101-102
Quantitative x-ray diffractometry....Pages 103-105
Determination of dead time....Pages 106-108
Contamination Lines In X-ray Spectra....Pages 109-112
Measurement of coating thickness on irregular shaped objects....Pages 113-115
Background variation....Pages 116-118
Use of primary filters for removal of characteristic tube lines....Pages 119-120
Calculation of ß filter thickness and transmission....Pages 121-122
Utilization of the ß filter and pulse height selector in diffractometry....Pages 123-125
Determination of lattice constants for a cubic lattice....Pages 126-128
Relative line intensities obtained on alkali halides....Pages 129-131
Line broadening....Pages 132-134
Back Matter....Pages 135-139